Yield & Robustness in Today’s Advanced Technology Nodes

Yield & Robustness in Today’s Advanced Technology Nodes -
Datum konání: 
18.03.2016

What is FinFET? How to repair chis online? How to design, manufacture, and test the advanced integrated circuits? Dr. Yervant Zorian is a leading expert in design and test of integrated circuits and one of the major representatives of IEEE. His lecture by prof. Svoboda Series of Distinguished Lectures on 18th March 2016, 11:00 a.m., lecture room T9:155.



Poslední změna: 1.1.1970, 2:00